test tech

test tech


3D NAND is a type of non-volatile flash memory in which the memory cells are stacked vertically in multiple layers. This technology provides higher storage capacity, faster read/write speeds, and lower power consumption compared to traditional planar NAND.

Power Loss Protection (PLP)

Power Loss Protection (PLP) ensures that data is not lost during sudden power failures. This technology provides a temporary power source to store data in the event of an unexpected power loss.

Flash Module with DRAM Buffer

A DRAM chip in a flash module functions the way a cache does in a hard disk. This technology enhances the performance of flash memory by using DRAM as a buffer.

Advanced LDPC ECC Engine

Advanced Low-Density Parity Check (LDPC) Error Correction Code (ECC) is an error-correcting mechanism that detects and corrects errors that occur during data transfer.